Micro-CT scans of Mt. Simon sandstone at residual conditions used for contact angle measurements and analyzing the influence of clay regions

Original micro-CT tiff stack

Segmented

No

Voxel length (x, y, z)

2.21, 2.21, 2.21 um

Sample

View Sample: Mt. Simon 6926

Analysis of this Data

• Top Cropped Cube Region of Interest
• Bottom Cropped Cubed Region of Interest